DJALAL, Muhammad Ruswandi; HR, Herman. Characteristic Test Of Transistor Based Multisim Software. Protek : Jurnal Ilmiah Teknik Elektro, [S. l.], v. 6, n. 2, p. 63–67, 2019. DOI: 10.33387/protk.v6i2.1214. Disponível em: https://ejournal.unkhair.ac.id/index.php/protk/article/view/1214. Acesso em: 7 jun. 2026.